| dc.contributor.author |
Rincon-Ortiz, Sergio A
|
|
| dc.contributor.author |
Rodriguez Pereira, Jhonatan
|
|
| dc.contributor.author |
Ospina, Rogelio
|
|
| dc.date.accessioned |
2021-05-15T18:52:22Z |
|
| dc.date.available |
2021-05-15T18:52:22Z |
|
| dc.date.issued |
2020 |
|
| dc.identifier.issn |
1055-5269 |
|
| dc.identifier.uri |
https://hdl.handle.net/10195/77408 |
|
| dc.description.abstract |
Niobium (V) ethoxide was characterized by x-ray photoelectron spectroscopy. The specimen is a powder purchased from Sigma Aldrich. The sample was fixed to a stainless-steel sample holder with a copper double-sided adhesive tape. Survey spectra, Nb 3d, O 1s, C 1s, Nb 3p, Nb 4p, O 2s core levels, and valence band spectra were acquired. Results showed how the elements in the niobium ethoxide structure are bonded. |
eng |
| dc.format |
"024014-1"-"024014-8" |
|
| dc.language.iso |
eng |
|
| dc.publisher |
American Institute of Physics |
eng |
| dc.relation.ispartof |
Surface Science Spectra, volume 27, issue: 2 |
eng |
| dc.rights |
open access |
eng |
| dc.subject |
niobium ethoxide |
eng |
| dc.subject |
XPS |
eng |
| dc.subject |
precursor |
eng |
| dc.subject |
etoxid niklu |
cze |
| dc.subject |
XPS |
cze |
| dc.subject |
prekurzor |
cze |
| dc.title |
Niobium ethoxide analyzed by XPS |
eng |
| dc.title.alternative |
Etoxid niobu analyzovaný pomocí XPS |
cze |
| dc.type |
article |
eng |
| dc.description.abstract-translated |
Etoxid niobu (V) byl analyzován pomocí rentgenové fotoelektronové spektroskopie (XPS). Vzorek představoval prášek od společnosti Sigma Aldrich. Vzorek byl uchycen na ocelový držák a mědenou oboustrannou lepící 3M pásku. V přehledovém spektru byly měřeny struktury jader Nb 3d, O 1s, C 1s, Nb 3p, Nb 4p, O 2s a také spektra valenčních pásů. Kvantitativní analýza povrdila očekávanou stechiometrii vzorku. |
cze |
| dc.peerreviewed |
yes |
eng |
| dc.publicationstatus |
postprint (accepted version) |
eng |
| dc.identifier.doi |
10.1116/6.0000472 |
|
| dc.relation.publisherversion |
https://avs.scitation.org/doi/full/10.1116/6.0000472 |
|
| dc.identifier.wos |
000596754200001 |
|
| dc.identifier.scopus |
2-s2.0-85097825913 |
|
| dc.identifier.obd |
39885125 |
|
